Product Introduction

Our GaAs (Gallium Arsenide) wafers are single-crystal substrates grownusing VGF or LEC methods, available in <100> and <111> orientations from 2" to 6" in diameter. Offered undoped or doped with Zn, Si, or Te, these wafers feature front-side surfaces polished in epi-ready prime grade, with mobility ranging from 1500 to 5000 cm²/V·sec depending on dopant type. Precision-controlled primary and secondary flats ensure accurate crystal orientation identification, making these wafers a reliable choice for demanding compound semiconductor applications.

Applications

- RF and microwave devices (power amplifiers, MMICs)
- LED and laser diode substrates
- High-efficiency solar cells (multi-junction and single-junction)
- High-electron-mobility transistors (HEMT) and heterojunction bipolar transistors (HBT)

Why Choose Us?

Dual VGF/LEC process routes for flexible selection based on application requirements. 

High‑precision primary and secondary orientation flats facilitate crystal orientation identification and automated production‑line processing. 

Wide mobility range (1500‑5000 cm²/V·sec) to meet diverse device performance requirements. 

Front‑side epitaxial‑grade polishing ensures stable and reliable surface quality.

Parameter Specification
GALLIUM ARSENIDE (GAAS) WAFER SPECIFICATION
DIAMTER 50 ~ 150MM ± 0.25MM(2″ 3″ 4″ 6″)
Material Single Crystal Gallium Arsenide
Growth Method VGF / LEC Grown
Crystal Orientation <100> / <111>
Crystal Orientation α 0 ± β 0, off angle α and accuracy β upon request
Dopant Undoped / Zn / Si / Te
Thickness 350 ± 25um / 550 ± 25um / 625 ± 25um
Mobility 1500 ~ 3000 / 3000 ~ 5000 cm2 / V·sec
Primary Flat <0-1-1> ± 0.5deg, 16 ±1.0mm / 22±1.0mm / 32.5±1.0mm
Secondary Flat <0-1-1> ± 5.0 deg, 8 ±1.0mm / 11±1.0mm / 18±1.0mm
Front-side Polished in Epi-ready Prime grade
Back-side Polished / Lapping or Etched
Epi-ready Yes